The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Jul. 02, 2022
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventors:

Xianjun Wu, Hefei, CN;

Weibing Shang, Hefei, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/4076 (2006.01); G11C 11/408 (2006.01); G11C 11/4096 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4076 (2013.01); G11C 11/4085 (2013.01); G11C 11/4096 (2013.01);
Abstract

A circuit includes a delay generation circuit. The delay generation circuit is configured to generate a sub-grab signal for each of the storage areas based on an initial grab signal and data transmission delay of each of the storage areas, and generate a grab enable signal based on all the sub-grab signals. A time interval between a time when the read-write control circuit receives data transmitted from each of the storage areas by a global data line and a time when the read-write control circuit receives the sub-grab signal corresponding to the storage area satisfies a preset range. The read-write control circuit is configured to read out data of the global data line to a data bus based on the grab enable signal. Therefore, the tCCD of the DRAM is optimized.


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