The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Aug. 04, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Zhengang Chen, San Jose, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 3/0619 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01);
Abstract

A method may comprise detecting an error associated with accessing a set of data items. The set of data items are programmed to a respective memory page associated with a stripe of a plurality of stripes. In response to determining that the set of data items comprises one or more codewords, a first data recovery process is performed to recover the one or more codewords based at least in part on RAIN redundancy metadata. In response to determining that the set of data items comprises additional parity metadata, a second data recovery process is performed to recover the additional parity metadata based at least in part on LUN redundancy metadata. In response to determining that the set of data items comprises RAIN redundancy metadata, a first data reconstruction process is performed to regenerate the RAIN redundancy metadata based at least in part on one or more sets of codewords.


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