The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Jun. 23, 2022
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Puneet Arora, Noida-Uttar Pradesh, IN;

Subhasish Mukherjee, Noida-Uttar Pradesh, IN;

Sarthak Singhal, Noida-Uttar Pradesh, IN;

Christos Papameletis, Apex, NC (US);

Brian Foutz, Charlottesville, VA (US);

Krishna V Chakravadhanula, Vestal, NY (US);

Ankit Bandejia, Greater Noida-Uttar Pradesh, IN;

Norman Card, Vestal, NY (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/317 (2006.01); G06F 11/267 (2006.01); G06F 30/333 (2020.01); G11C 29/32 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/318547 (2013.01); G01R 31/31704 (2013.01); G01R 31/3185 (2013.01); G01R 31/318558 (2013.01); G01R 31/318563 (2013.01); G01R 31/318583 (2013.01); G06F 11/267 (2013.01); G06F 30/333 (2020.01); G11C 29/32 (2013.01); G11C 2029/3202 (2013.01);
Abstract

This disclosure relates scan chain stitching. In one example, scan chain elements from a scan chain element space can be received for a scan chain partition. The scan chain elements can be grouped based on scan chain element grouping criteria to form scan chain groups. Scan chain data identifying a number of scan chains for the scan chain partition can be received. The scan chains can be scan chain balanced across the scan chain groups to assign each scan chain to one of the scan chain groups. The scan chain elements associated with each scan chain of the scan chains can be scan chain element balanced. Scan chain elements for each associated scan chain can be connected to form a scan chain data test path during a generation of scan chain circuitry in response to the scan chain element balancing.


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