The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Sep. 08, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Ming-Hong Chang, Hsin-Chu, TW;

Chun-Yi Yang, Hsinchu, TW;

Kun-Ming Huang, Taipei, TW;

Po-Tao Chu, New Taipei, TW;

Shen-Ping Wang, Keelung, TW;

Chien-Li Kuo, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/31 (2006.01); H01L 23/00 (2006.01); H01L 23/50 (2006.01); H01L 23/522 (2006.01); H01L 23/528 (2006.01); H01L 23/29 (2006.01);
U.S. Cl.
CPC ...
H01L 24/05 (2013.01); H01L 23/31 (2013.01); H01L 23/3171 (2013.01); H01L 23/3178 (2013.01); H01L 23/50 (2013.01); H01L 23/5226 (2013.01); H01L 23/528 (2013.01); H01L 24/02 (2013.01); H01L 24/03 (2013.01); H01L 23/291 (2013.01); H01L 23/293 (2013.01); H01L 23/3114 (2013.01); H01L 23/3192 (2013.01); H01L 23/564 (2013.01); H01L 2224/03831 (2013.01); H01L 2224/0391 (2013.01); H01L 2224/05025 (2013.01); H01L 2224/05124 (2013.01); H01L 2224/05147 (2013.01); H01L 2924/1033 (2013.01);
Abstract

An integrated circuit (IC) comprising an enhanced passivation scheme for pad openings and trenches is provided. In some embodiments, an interlayer dielectric (ILD) layer covers a substrate and at least partially defines a trench. The trench extends through the ILD layer from a top of the ILD layer to the substrate. A conductive pad overlies the ILD layer. A first passivation layer overlies the ILD layer and the conductive pad, and further defines a pad opening overlying the conductive pad. A second passivation layer overlies the ILD layer, the conductive pad, and the first passivation layer, and further lines sidewalls of the first passivation layer in the pad opening and sidewalls of the ILD layer in the trench. Further, the second passivation layer has a low permeability for moisture or vapor relative to the ILD layer.


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