The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Nov. 23, 2021
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Yangyang Sun, San Jose, CA (US);

Jinxin Fu, Fremont, CA (US);

Kazuya Daito, Milpitas, CA (US);

Ludovic Godet, Sunnyvale, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G02B 19/00 (2006.01); G02B 27/30 (2006.01); G06T 7/00 (2017.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G01M 11/0264 (2013.01); G02B 19/0047 (2013.01); G02B 27/30 (2013.01); G06T 7/0002 (2013.01); H04N 23/56 (2023.01); G06T 2207/10152 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30204 (2013.01);
Abstract

Embodiments described herein provide for light engines of a measurement system and methods of using the light engines. The measurement system includes a light engine operable to illuminate a first grating of an optical device. The light engine projects a pattern with a light from a light engine. The light engine projects a pattern to the first grating such that a metrology metric may be extracted from one or more images captured by a detector of the measurement system. The metrology metrics are extracted by processing the image. The metrology metrics determine if the optical device meets image quality standards.


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