The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Sep. 27, 2022
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Krishna Chakravadhanula, Vestal, NY (US);

Brian Foutz, Charlottesville, VA (US);

Prateek Kumar Rai, Uttar Pradesh, IN;

Sarthak Singhal, Noida-Uttar Pradesh, IN;

Christos Papameletis, Apex, NC (US);

Vivek Chickermane, Slaterville Springs, NY (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 30/327 (2020.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 30/327 (2020.01); G01R 31/318583 (2013.01);
Abstract

A system includes a memory that stores instructions and receives a circuit netlist, and includes a processing unit that accesses the memory and executes the instructions. The instructions include an EDA application that includes a test-point flop allocation module that is configured to evaluate the circuit netlist to determine compatibility of the test-point nodes in the circuit netlist. The test-point flop allocation module can further allocate each of the test-point flops to a test-point sharing group comprising a plurality of compatible test-point nodes. The EDA application also includes a circuit layout module configured to generate a circuit layout associated with the circuit design, the circuit layout comprising the functional logic and scan-chains comprising the test-point flops allocated to the test-point sharing groups in response to the circuit netlist. The circuit layout is employable to fabricate an integrated circuit (IC) chip.


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