The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Aug. 23, 2021
Applicant:

Nova Ltd., Rehovot, IL;

Inventors:

Gil Loewenthal, Tel-Aviv, IL;

Shay Yogev, Kibbutz Kfar Menachem, IL;

Yoav Etzioni, Tel Aviv, IL;

Assignee:

NOVA LTD., Rehovot, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G01B 11/24 (2006.01); G01N 21/95 (2006.01); H01L 21/311 (2006.01); H01L 21/67 (2006.01); H10B 41/27 (2023.01); H10B 43/27 (2023.01);
U.S. Cl.
CPC ...
H01L 22/26 (2013.01); G01B 11/24 (2013.01); G01N 21/9501 (2013.01); H01L 21/31111 (2013.01); H01L 21/67253 (2013.01); G01B 2210/56 (2013.01); H10B 41/27 (2023.02); H10B 43/27 (2023.02);
Abstract

Controlling an etch process applied to a multi-layered structure, by calculating a spectral derivative of reflectance of an illuminated region of interest of a multi-layered structure during an etch process applied to the multi-layered structure, identifying in the spectral derivative a discontinuity that indicates that an edge of a void formed by the etch process at the region of interest has crossed a layer boundary of the multi-layered structure, determining that the crossed layer boundary corresponds to a preselected layer boundary of the multi-layered structure, and applying a predefined control action to the etch process responsive to determining that the crossed layer boundary corresponds to the preselected layer boundary of the multi-layered structure.


Find Patent Forward Citations

Loading…