The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Apr. 29, 2019
Applicant:

Acm Research (Shanghai) Inc., Shanghai, CN;

Inventors:

Zhaowei Jia, Shanghai, CN;

Jian Wang, Shanghai, CN;

Hui Wang, Shanghai, CN;

Hongchao Yang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/18 (2006.01); C25D 7/12 (2006.01); C25D 17/00 (2006.01); C25D 17/06 (2006.01); C25D 17/12 (2006.01); C25D 21/12 (2006.01); H01L 21/288 (2006.01); H01L 21/687 (2006.01); H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
C25D 5/18 (2013.01); C25D 7/12 (2013.01); C25D 17/001 (2013.01); C25D 17/06 (2013.01); C25D 17/12 (2013.01); C25D 21/12 (2013.01); H01L 21/2885 (2013.01); H01L 21/68764 (2013.01); H01L 23/544 (2013.01); H01L 2223/54493 (2013.01);
Abstract

Embodiments of the present invention provide an electroplating apparatus for electroplating on a surface of a wafer, which comprising a plurality of electrodes, for forming electric fields on the surface of the wafer, an independent electric field is formed in a designated area, when a notch of the wafer is positioned within the designated area, a total amount of power received by the notch is reduced. Embodiments of the present invention also provide an electroplating method for electroplating on a surface of a wafer, the method controlling the plurality of electrodes to form electric fields on the surface of the wafer, an independent electric field is formed in a designated area, when a notch of the wafer is positioned within the designated area, a total amount of power received by the notch is reduced. The present invention is more accurate and reliable, the electroplating efficiency is also increased.


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