The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2024
Filed:
Oct. 01, 2021
Micron Technology, Inc., Boise, ID (US);
Harish Reddy Singidi, Fremont, CA (US);
Vamsi Pavan Rayaprolu, San Jose, CA (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Jianmin Huang, San Carlos, CA (US);
Xiangang Luo, Fremont, CA (US);
Ashutosh Malshe, Fremont, CA (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A variety of applications can include apparatus and/or methods to preemptively detect defect prone memory blocks in a memory device and handle these memory blocks before they fail and trigger a data loss event. Metrics based on memory operations can be used to facilitate the examination of the memory blocks. One or more metrics associated with a memory operation on a block of memory can be tracked and a Z-score for each metric can be generated. In response to a comparison of a Z-score for a metric to a Z-score threshold for the metric, operations can be performed to control possible retirement of the memory block beginning with the comparison. Additional apparatus, systems, and methods are disclosed.