The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jul. 15, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Kuan Wei Tseng, Taichung, TW;

Brandon P. Wirz, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 19/02 (2006.01); H05K 13/08 (2006.01); B25J 13/08 (2006.01); H01L 23/00 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1633 (2013.01); B25J 13/085 (2013.01); B25J 19/028 (2013.01); H01L 21/67144 (2013.01); H01L 24/75 (2013.01); H05K 13/082 (2018.08); H01L 2224/7565 (2013.01); H01L 2224/7592 (2013.01);
Abstract

An apparatus for handling microelectronic devices comprises a pick arm having a pick surface configured for receiving a microelectronic device thereon, drives for moving the pick arm and reorienting the pick surface in the X, Y and Z planes and about a horizontal rotational axis and a vertical rotational axis, and a sensor device carried by the pick arm and configured to detect at least one of at least one magnitude of force and at least one location of force applied between the pick surface and a structure contacted by the pick surface or a structure and a microelectronic device carried on the pick surface.


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