The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Nov. 23, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Lars Liebmann, Mechanicville, NY (US);

Jeffrey Smith, Clifton Park, NY (US);

Anton J. deVilliers, Clifton Park, NY (US);

Kandabara Tapily, Mechanicville, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 29/423 (2006.01); H01L 23/535 (2006.01); H01L 29/417 (2006.01); H01L 23/528 (2006.01); H01L 29/08 (2006.01); H01L 21/3213 (2006.01); H01L 21/822 (2006.01); H01L 21/8238 (2006.01); H01L 21/768 (2006.01); H03K 19/0948 (2006.01); H01L 27/02 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 21/32139 (2013.01); H01L 21/76895 (2013.01); H01L 21/8221 (2013.01); H01L 21/823828 (2013.01); H01L 21/823871 (2013.01); H01L 23/528 (2013.01); H01L 23/535 (2013.01); H01L 27/0207 (2013.01); H01L 29/0847 (2013.01); H01L 29/1033 (2013.01); H01L 29/41758 (2013.01); H01L 29/42376 (2013.01); H03K 19/0948 (2013.01);
Abstract

In a method of forming a semiconductor device, a plurality of transistor pairs is formed to be stacked over a substrate. The plurality of transistor pairs have a plurality of gate electrodes that are stacked over the substrate and electrically coupled to gate structures of the plurality of transistor pairs, and a plurality of source/drain (S/D) local interconnects that are stacked over the substrate and electrically coupled to source regions and drain regions of the plurality of transistor pairs. A sequence of vertical and lateral etch steps are performed to etch the plurality of the gate electrodes and the plurality of S/D local interconnects so that the plurality of the gate electrodes and the plurality of S/D local interconnects have a staircase configuration.


Find Patent Forward Citations

Loading…