The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Sep. 27, 2021
Applicant:

Macronix International Co., Ltd., Hsinchu, TW;

Inventors:

Pei-Ci Jhang, Hsinchu County, TW;

Chi-Pin Lu, Zhubei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11568 (2017.01); H10B 43/30 (2023.01); H10B 43/20 (2023.01);
U.S. Cl.
CPC ...
H10B 43/30 (2023.02); H10B 43/20 (2023.02);
Abstract

A memory structure and a manufacturing method for the same are provided. The memory structure includes a charge trapping layer, a first silicon oxynitride tunneling film and a second silicon oxynitride tunneling film. The first silicon oxynitride tunneling film is between the charge trapping layer and the second silicon oxynitride tunneling film. A first atom concentration ratio of a concentration of a nitrogen atom to a total concentration of an oxygen atom and the nitrogen atom of the first silicon oxynitride tunneling film is 10% to 50%. A second atom concentration ratio of a concentration of a nitrogen atom to a total concentration of an oxygen atom and the nitrogen atom of the second silicon oxynitride tunneling film is 1% to 15%. The concentration of the nitrogen atom of the second silicon oxynitride tunneling film is lower than that of the first silicon oxynitride tunneling film.


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