The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Mar. 18, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Hideyuki Hatta, Tokyo, JP;

Rina Tanaka, Tokyo, JP;

Katsutoshi Sugawara, Tokyo, JP;

Yutaka Fukui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/16 (2006.01); H01L 29/872 (2006.01);
U.S. Cl.
CPC ...
H01L 29/1608 (2013.01); H01L 29/872 (2013.01);
Abstract

The present invention relates to a silicon carbide semiconductor device that includes a Schottky barrier diode in a field-effect transistor and includes a first trench provided through first and second semiconductor regions in a thickness direction and reaches inside a semiconductor layer, a second trench provided through the second semiconductor region in the thickness direction and reaches inside the semiconductor layer, a gate electrode embedded in the first trench via a gate insulating film, a Schottky barrier diode electrode embedded in the second trench, a first low-resistance layer having contact with a trench side wall of the first trench, and a second low-resistance layer having contact with a trench side wall of the second trench. The second low-resistance layer has an impurity concentration that is higher than the impurity concentration in the semiconductor layer and lower than the impurity concentration in the first low-resistance layer.


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