The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Feb. 11, 2022
Applicant:

Changxin Memory Technologies, Inc., Anhui, CN;

Inventors:

Qiang Wan, Hefei, CN;

Jun Xia, Hefei, CN;

Kangshu Zhan, Hefei, CN;

Tao Liu, Hefei, CN;

Penghui Xu, Hefei, CN;

Sen Li, Hefei, CN;

Yanghao Liu, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/308 (2006.01); H01L 21/02 (2006.01); H01L 21/027 (2006.01); H10B 12/00 (2023.01);
U.S. Cl.
CPC ...
H01L 21/3086 (2013.01); H01L 21/0228 (2013.01); H01L 21/0273 (2013.01); H10B 12/03 (2023.02); H10B 12/30 (2023.02);
Abstract

A method for manufacturing a semiconductor structure includes: providing a base; forming multiple discrete first mask layers on the base; forming multiple sidewall layers, in which each sidewall layer is configured to encircle one of the first mask layers, and each sidewall layer is connected to closest sidewall layers, the side walls, away from the first mask layers, of multiple connected sidewall layers define initial first vias and each of the initial first vias is provided with chamfers; removing the first mask layers, and each sidewall layer defines a second via; after removing the first mask layers, forming repair layers which are located on the side walls, away from the second vias, of the sidewall layers and fill the chamfers of the initial first vias to form first vias; and etching the base along the first vias and the second vias to form capacitor holes on the base.


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