The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Oct. 24, 2022
Applicant:

Kla Corporation, Milpitas, CA (US);

Inventors:

Henning Stoschus, Wetzlar, DE;

Stefan Eyring, Weilburg, DE;

Christopher Sears, Fremont, CA (US);

Assignee:

KLA CORPORATION, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/22 (2006.01); H01J 37/28 (2006.01); H01J 37/304 (2006.01); G01N 23/2251 (2018.01); H01L 21/66 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H01J 37/304 (2013.01); G01N 23/2251 (2013.01); G06N 20/00 (2019.01); H01J 37/222 (2013.01); H01L 22/12 (2013.01); H01J 2237/221 (2013.01); H01J 2237/24475 (2013.01);
Abstract

Embodiments may include methods, systems, and apparatuses for correcting a response function of an electron beam tool. The correcting may include modulating an electron beam parameter having a frequency; emitting an electron beam based on the electron beam parameter towards a specimen, thereby scattering electrons, wherein the electron beam is described by a source wave function having a source phase and a landing angle; detecting a portion of the scattered electrons at an electron detector, thereby yielding electron data including an electron wave function having an electron phase and an electron landing angle; determining, using a processor, a phase delay between the source phase and the electron phase, thereby yielding a latency; and correcting, using the processor, the response function of the electron beam tool using the latency and a difference between the source wave function and the electron wave function.


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