The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Aug. 13, 2021
Ansys, Inc., Canonsburg, PA (US);
Deqi Zhu, San Jose, CA (US);
Hua Chen, Chengdu, CN;
Jimin Wen, Pleasanton, CA (US);
Lang Lin, Cupertino, CA (US);
Norman Chang, Fremont, CA (US);
Dinesh Selvakumaran, Pflugerville, TX (US);
Gang Ni, Chengdu, CN;
ANSYS, INC., Canonsburg, PA (US);
Abstract
A method in one embodiment creates a model of an authentic IC for use in comparisons with counterfeit ICs. The model can be created by determining a first or initial set of points of interest (POIs) on the simulated physical (e.g., gate level) layout and simulating side channel leakage from each POI and then expanding the size of the POI and repeating the simulation and comparing successive simulation results (between successive sizes of POIs for a given POI) to determine if a solution for the size of the POI has converged. The final POIs are then processed in a simulation that can use multiple payloads (e.g., cryptographic data) over the entire set of final POIs, and the resulting data set can be used to create the model.