The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Oct. 21, 2019
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Yue Ma, Escondido, CA (US);

Dzmitry Labetski, Eindhoven, NL;

Andrew David LaForge, Poway, CA (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); H05G 2/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70858 (2013.01); G03F 7/70033 (2013.01); H05G 2/008 (2013.01);
Abstract

Disclosed is a source for and method of generating extreme ultraviolet radiation in which spitting of molten target material is hindered through depletion of the number of hydrogen radicals available to enter deposits of molten target material and create hydrogen bubbles therein by introducing an active gas that reacts with the hydrogen radicals.


Find Patent Forward Citations

Ma, Yue. (2024). Apparatus for and method of reducing contamination from source material in an euv light source (U.S. Patent No. 11874608). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11874608

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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