The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Jun. 17, 2021
Micron Technology, Inc., Boise, ID (US);
Sampath K. Ratnam, Boise, ID (US);
Vamsi Pavan Rayaprolu, San Jose, CA (US);
Mustafa N. Kaynak, San Diego, CA (US);
Sivagnanam Parthasarathy, Carlsbad, CA (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Shane Nowell, Boise, ID (US);
Peter Feeley, Boise, ID (US);
Qisong Lin, El Dorado Hills, CA (US);
MICRON TECHNOLOGY, INC., Boise, ID (US);
Abstract
At least one data of a set of data stored at a memory cell of a memory component is determined to be associated with an unsuccessful error correction operation. A determination is made as to whether a programming operation associated with the set of data stored at the memory cell has completed. The at least one data of the set of data stored at the memory cell that is associated with the unsuccessful error correction operation is recovered in response to determining that the programming operation has completed. Another memory cell of the memory component is identified in response to recovering the at least one data of the set of data stored at the memory cell that is associated with the unsuccessful error correction operation. The set of data including the recovered at least one data is provided to the other memory cell of the memory component.