The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jun. 29, 2021
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventors:

Yong Lu, Hefei, CN;

Gongyi Wu, Hefei, CN;

Hongkun Shen, Hefei, CN;

Qiuhu Pang, Hefei, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10B 12/00 (2023.01); H01L 21/762 (2006.01); H01L 23/532 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H10B 12/488 (2023.02); H01L 21/76224 (2013.01); H01L 23/53271 (2013.01); H01L 29/0607 (2013.01); H01L 29/78 (2013.01); H10B 12/053 (2023.02); H10B 12/34 (2023.02);
Abstract

The present disclosure discloses a semiconductor device and a method for manufacturing a semiconductor device. The method for manufacturing a semiconductor device includes following steps: providing a semiconductor substrate, and forming active regions and trench isolation structures in the semiconductor substrate, wherein the trench isolation structures are located between the active regions; forming first grooves in the active regions; filling the first grooves to form inversion polysilicon layers, the inversion polysilicon layers being inversely doped with the active regions; forming second grooves, the second grooves running through the polysilicon layers and a part of the semiconductor substrate, and reserving parts of the inversion polysilicon layers located on side faces of the second grooves; and, forming buried word line structures in the second grooves.


Find Patent Forward Citations

Loading…