The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Mar. 17, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Takahiro Kawawa, Yamanashi, JP;

Hideomi Hosaka, Yamanashi, JP;

Kouichi Nakajima, Yamanashi, JP;

Masamichi Hara, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/683 (2006.01); C23C 16/458 (2006.01); G01R 29/24 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32697 (2013.01); C23C 16/4583 (2013.01); G01R 29/24 (2013.01); H01J 37/32715 (2013.01); H01L 21/6831 (2013.01); H01J 2237/0206 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/20214 (2013.01);
Abstract

In a substrate processing apparatus for processing a substrate, a processing chamber accommodating the substrate is provided. A mounting table is disposed in the processing chamber and configured to attract and hold the substrate using an electrostatic attractive force. A charge amount measurement unit is disposed in the processing chamber and configured to measure charge amount of a substrate attraction surface of the mounting table. A charge neutralization mechanism is configured to neutralize the substrate attraction surface of the mounting table. A retreating mechanism is configured to make the charge amount measurement unit retreat from a measurement position facing the substrate attraction surface of the mounting table.


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