The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

May. 19, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Gaurav Gupta, Hsinchu, TW;

Zhiqiang Wu, Chubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/10 (2006.01); G11C 11/16 (2006.01); H10B 61/00 (2023.01); H10N 50/80 (2023.01); H10N 50/85 (2023.01);
U.S. Cl.
CPC ...
G11C 11/1673 (2013.01); G11C 11/161 (2013.01); G11C 11/1659 (2013.01); H10B 61/22 (2023.02); H10N 50/80 (2023.02); G11C 11/1657 (2013.01); H10N 50/85 (2023.02);
Abstract

In some embodiments, the present application provides a memory device. The memory device includes a memory cell array comprising a plurality of magnetic tunnel junction (MTJ) memory cells arranged in columns and rows, a read bias circuit connected to the memory cell array and configured to provide a reading bias for a MTJ memory cell of the memory cell array, and a first non-linear resistance device connected in series and between the MTJ memory cell and the read bias circuit. The first non-linear resistance device is configured to provide a first resistance when conducting a first current and a second resistance greater than the first resistance when conducting a second current smaller than the first current.


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