The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Dec. 08, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Agatino Massimo Maccarrone, Regalbuto, IT;

Luigi Pilolli, L'Aquila, IT;

Ali Feiz Zarrin Ghalam, Sunnyvale, CA (US);

Chin Yu Chen, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 8/00 (2006.01); G11C 7/22 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 7/222 (2013.01); G11C 7/1087 (2013.01); G11C 7/1093 (2013.01); G11C 2207/2254 (2013.01);
Abstract

Disclosed are systems and methods involving memory-side write training to improve data valid window. In one implementation, a method for performing memory-side write training may comprise delaying a rising edge or a falling edge of a first data signal, delaying a rising edge or a falling edge of a second data signal, and aligning the two adjusted signals to reduce a window of time that the data signals are not valid and thereby improve or optimize the data valid window (DVW) of a memory array. According to implementations herein, various edges of data signals and clock signals may be adjusted or delayed via dedicated trim cells or circuitry present in the data paths located on the memory side of a system.


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