The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Dec. 22, 2021
Applicant:

Xepic Corporation Limited, Nanjing, CN;

Inventor:

Yang-Trung Lin, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0706 (2013.01); G06F 11/1608 (2013.01);
Abstract

A method for tracing an error of a logic system design includes obtaining an assertion failure of a combinational cone of the logic system design, the combinational cone including a plurality of sub-cones; and obtaining machine learning models of the sub-cones. Each sub-cone represents a sub-circuitry of the logic system design and has one or more input signals and an output signal. The assertion failure indicates an actual signal value of the combinational cone at a current clock cycle being different from an expected output value at the current clock cycle. The method also includes: performing backtracing on the sub-cones according to the assertion failure, the machine learning models of the sub-cones, and dynamic backtracing sensitivities corresponding to the sub-cones, to obtain a backtracing result; and outputting one or more target sub-cones as candidate root causes of the assertion failure according to the backtracing result.


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