The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Aug. 31, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chih Chieh Yeh, Taipei, TW;

Ming-Shuan Li, Hsinchu County, TW;

Chih-Hung Wang, Hsinchu, TW;

Zi-Ang Su, Taoyuan County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/861 (2006.01); H01L 29/417 (2006.01); H01L 21/8234 (2006.01); H01L 21/265 (2006.01); H01L 27/06 (2006.01); H01L 21/266 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66136 (2013.01); H01L 21/2652 (2013.01); H01L 21/823418 (2013.01); H01L 21/823475 (2013.01); H01L 21/823493 (2013.01); H01L 27/0629 (2013.01); H01L 29/417 (2013.01); H01L 29/8613 (2013.01); H01L 21/266 (2013.01); H01L 21/823431 (2013.01);
Abstract

A method includes providing a first semiconductor layer at a frontside of a structure; implanting first dopants of a first conductivity-type into the first semiconductor layer, resulting in a doped layer in the first semiconductor layer; forming a stack of semiconductor layers over the first semiconductor layer; patterning the stack of semiconductor layers and the first semiconductor layer into fins; forming an isolation structure adjacent to a lower portion of the fins; etching the stack of semiconductor layers to form a source/drain trench over the first semiconductor layer; forming a source/drain feature in the source/drain trench, wherein the source/drain feature is doped with second dopants of a second conductivity-type opposite to the first conductivity-type; forming a contact hole at a backside of the structure, wherein the contact hole exposes the doped layer in the first semiconductor layer; and forming a first contact structure in the contact hole.


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