The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Nov. 02, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Kishore Kumar Muchherla, San Jose, CA (US);

Shane Nowell, Boise, ID (US);

Mustafa N. Kaynak, San Diego, CA (US);

Sampath K. Ratnam, San Jose, CA (US);

Peter Feeley, Boise, ID (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Devin M. Batutis, San Jose, CA (US);

Xiangang Luo, Fremont, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 16/26 (2006.01); G11C 29/44 (2006.01); G11C 16/10 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01); G11C 29/12005 (2013.01); G11C 29/44 (2013.01);
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including performing, on data residing in a block of the memory device, an error-handling operation of a plurality of error-handling operations, wherein an order of the plurality of error-handling operations is based on a voltage offset bin associated with the block, wherein the voltage offset bin defines a set of threshold voltage offsets to be applied to a base voltage read level during read operations; and responsive to determining that the error-handling operation has failed to recover the data, adjusting the order of the plurality of error-handling operations.


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