The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Mar. 10, 2022
Applicant:

Siemens Industry Software Inc., Plano, TX (US);

Inventors:

Lianghong Yin, Fremont, CA (US);

Fan Jiang, Beaverton, OR (US);

Shumay D. Shang, Saratoga, CA (US);

Le Hong, Benicia, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); G06F 30/392 (2020.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); G06F 30/392 (2020.01);
Abstract

Various aspects of the present disclosed technology relate to techniques for classifying layout patterns. First, a set of density feature vectors for a set of layout regions in the layout design are extracted using a set of rings. Each component of a density feature vector in the set of density feature vectors corresponds to a ring in the set of rings. The set of rings do not overlap with each other and cover a whole area of a circle when being placed together. Next, a machine learning-based clustering process is performed to separate layout features in the set of layout regions into clusters of layout features based on the set of density feature vectors. Each of the clusters of layout features may be further divided into subclusters based on one or more properties.


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