The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Jan. 28, 2022
Applicant:

Sien (Qingdao) Integrated Circuits Co., Ltd., Shandong, CN;

Inventors:

Zhaosheng Meng, Qingdao, CN;

Zhuangzhuang Wu, Qingdao, CN;

Min-Hwa Chi, Qingdao, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/14 (2006.01); H01L 21/02 (2006.01); C23C 16/455 (2006.01); C30B 29/36 (2006.01); C30B 25/10 (2006.01); C30B 25/12 (2006.01); C30B 33/02 (2006.01); C23C 16/32 (2006.01);
U.S. Cl.
CPC ...
C30B 25/14 (2013.01); C23C 16/325 (2013.01); C23C 16/45544 (2013.01); C30B 25/10 (2013.01); C30B 25/12 (2013.01); C30B 29/36 (2013.01); C30B 33/02 (2013.01); H01L 21/0262 (2013.01); H01L 21/02529 (2013.01);
Abstract

The present invention relates to an ALD (Atomic layer deposition) apparatus and an ALD method. The ALD apparatus is provided with a reacting chamber and an annealing chamber, in which the reacting chamber is positioned with several heaters, a substrate to be deposited with an epitaxial layer may be transferred between different heaters, and each heater may independently moderate temperature. Different heaters correspond to different ALDs, and the number of the heaters may be varied to meet required a film to be deposited or composition of a crystal material. Because the heaters may be optimized to adapt to required temperature of different reactant gases, thickness of the epitaxial layer will meet expectation, and quality of the epitaxial layer will be promoted. Meanwhile, moderating the temperature independently may raise yield of production. Further, the ALD apparatus of the present invention introduces gas both horizontally and vertically to form a more even airflow field which benefits in forming a high-quality epitaxial layer.


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