The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Aug. 06, 2021
Applicant:

Utac Headquarters Pte. Ltd., Singapore, SG;

Inventors:

Saravuth Sirinorakul, Bangkok, TH;

Preecha Joymak, Bangkok, TH;

Natawat Kasikornrungroj, Bangkok, TH;

Wasu Aingkaew, Bangkok, TH;

Kawin Saiubol, Bangkok, TH;

Thanawat Jaengkrajarng, Bangkok, TH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/31 (2006.01); H01L 21/56 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3185 (2013.01); H01L 21/565 (2013.01); H01L 24/32 (2013.01); H01L 24/83 (2013.01); H01L 2224/32155 (2013.01); H01L 2924/10157 (2013.01);
Abstract

A semiconductor device has a semiconductor die with a sensor and a cavity formed into a first surface of the semiconductor die to provide access to the sensor. A protective layer is formed on the first surface of the semiconductor die around the cavity. An encapsulant is deposited around the semiconductor die. The protective layer blocks the encapsulant from entering the cavity. With the cavity clear of encapsulant, liquid or gas has unobstructed entry into cavity during operation of the semiconductor die. The clear entry for the cavity provides reliable sensor detection and measurement. The semiconductor die is disposed over a leadframe. The semiconductor die has a sensor. The protective layer can be a film. The protective layer can have a beveled surface. A surface of the leadframe can be exposed from the encapsulant. A second surface of the semiconductor die can be exposed from the encapsulant.


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