The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Oct. 19, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Scott E. Smith, Plano, TX (US);

Randy Brian Drake, Meridian, ID (US);

Brian Ladner, Fairview, TX (US);

Thanh Kim Mai, Allen, TX (US);

Sujeet Ayyapureddi, Boise, ID (US);

Matthew Alan Prather, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/40 (2006.01); G06F 11/10 (2006.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G06F 13/4027 (2013.01); G06F 11/1076 (2013.01); G06F 13/1668 (2013.01);
Abstract

The systems and methods described herein relate to a bi-directional data path (DQ) symbol map generated based on error correction operations. A device may include sub-wordline drivers and bi-directional data paths (DQs) that couple between the sub-wordline drivers and input/output (I/O) interface circuitry based on assignments indicated by the DQ symbol map. The assignments may be generated based on error correction operations performed on data of the memory bank. In particular, the DQ symbol map may be generated to avoid some conditions that, if occurring, may render one or more data errors uncorrectable. These systems and methods may reduce a likelihood of a data error associated with a DQ being uncorrectable.


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