The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Mar. 25, 2020
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Naoki Miyashima, Aizuwakamatsu, JP;

Takanori Kobayashi, Aizuwakamatsu, JP;

Kazunari Maki, Aizuwakamatsu, JP;

Shinichi Funaki, Aizuwakamatsu, JP;

Hiroyuki Mori, Kitamoto, JP;

Yuki Ito, Kitamoto, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C22C 9/00 (2006.01); C25D 5/34 (2006.01); B32B 15/01 (2006.01); B32B 15/20 (2006.01); C25D 5/50 (2006.01);
U.S. Cl.
CPC ...
C22C 9/00 (2013.01); B32B 15/018 (2013.01); B32B 15/20 (2013.01); C25D 5/34 (2013.01); C25D 5/50 (2013.01); Y10T 428/12903 (2015.01);
Abstract

To improve adhesion between a plating film reducing contact electrical resistance and a copper alloy plate containing Mg. A copper alloy plate containing Mg of more than 1.2% by mass and 2% by mass or less and the balance Cu and inevitable impurities in a center portion in a plate thickness direction, in the copper alloy plate, a surface Mg concentration at a surface is 30% or less of a center Mg concentration at the center portion in the plate thickness direction, a surface layer portion having a depth from the surface to where a Mg concentration is 90% of the center Mg concentration is provided, and in the surface layer portion, the Mg concentration increases from the surface toward the center portion of the plate thickness direction with a concentration gradient of 0.2% by mass/μm or more and 50% by mass/μm or less.


Find Patent Forward Citations

Loading…