The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Jan. 19, 2023
Arteris, Inc., Campbell, CA (US);
Benoit de Lescure, Campbell, CA (US);
Moez Cherif, Santa Cruz, CA (US);
ARTERIS, INC., Campbell, CA (US);
Abstract
Qualifying networks properties that can be used for topology generation of networks, such as a network-on-chip (NoC). In accordance with various embodiments and different aspects of the invention, quality metrics are generated, analyzed, and used to determine a quantitative quality set of values for a given generated solution for a network. The method disclosed allows the network designer or an automated network generation process to determine if the results produced are a good, an average or a bad solution. The advantage of the invention includes simplification of design process and the work of the designer by using quality metrics. Various quality metrics are generated using network definitions. These quality metrics provide quality evaluation and the quality assessment of the optimization process for a generated (optimized) network. The quality metrics include analyzing latency through a network and analyzing total wire length used by the network.