The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Dec. 18, 2019
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Naoki Miyashima, Aizuwakamatsu, JP;

Kazunari Maki, Aizuwakamatsu, JP;

Shinichi Funaki, Aizuwakamatsu, JP;

Kenji Kubota, Naka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/10 (2006.01); C22C 9/00 (2006.01); C25D 5/50 (2006.01);
U.S. Cl.
CPC ...
C25D 5/10 (2013.01); C22C 9/00 (2013.01); C25D 5/505 (2013.01); Y10T 428/12903 (2015.01);
Abstract

A copper alloy plate including 0.3 mass % or more and 1.2 mass % or less of Mg, 0.001 mass % or more and 0.2 mass % or less of P, and the balance Cu with inevitable impurities in a thickness center portion in a plate thickness direction; Mg concentration on a plate surface is 30% or less of bulk Mg concentration at the thickness center portion; a surface layer part having a depth from the plate surface to where it is 90% of the bulk Mg concentration is provided; and in the surface layer part, the Mg concentration increases from the plate surface toward the thickness center portion with a concentration gradient 1.8 mass %/μm or more and 50 mass %/μm or less.


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