The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jan. 26, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Erik V. Pohlmann, Boise, ID (US);

Neal J. Koyle, Nampa, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/22 (2006.01); G11C 8/18 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 7/222 (2013.01); G11C 7/1069 (2013.01); G11C 7/1096 (2013.01); G11C 8/18 (2013.01);
Abstract

Methods, systems, and devices for memory clock management and estimation procedures are described. A host device may determine a quantity of clock cycles associated with a duration for accessing a memory cell of a memory array based on truncating a value of a first parameter associated with another duration for a clock to perform a clock cycle. The host device may estimate a value of a second parameter related to (e.g., inversely proportional) to the truncated value of the first parameter and related to (e.g., directly proportional) to a correction factor, and may adjust (e.g., truncate) a third parameter to determine the quantity of clock cycles. Additionally or alternatively, the host device may adjust (e.g., perform a ceiling operation on) the second parameter to determine the quantity of clock cycles. The host device may access the memory cell based on the quantity of clock cycles.


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