The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Dec. 10, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G06F 11/07 (2006.01); G01R 31/3177 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01); G06F 11/30 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G01R 31/3177 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01); G06F 11/0727 (2013.01); G06F 11/0754 (2013.01); G06F 11/0772 (2013.01); G06F 11/1072 (2013.01); G06F 11/3037 (2013.01); G11C 29/028 (2013.01); G11C 29/1201 (2013.01); G01R 31/318597 (2013.01);
Abstract
Methods, systems, and devices for memory health status reporting are described. A memory device may output to a host device a parameter value, which may be indicative of metric or condition related to the performance or reliability (e.g., a health status) of the memory device of the memory device. The host device may thereby determine that the memory device is degraded, possibly prior to device or system failure. Based on the parameter value, the host device may take preventative action, such as quarantining the memory device, deactivating the memory device, or swapping the memory device for another memory device.