The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Aug. 11, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Andrea Redaelli, Casatenovo, IT;

Innocenzo Tortorelli, Cernusco sul Naviglio, IT;

Agostino Pirovano, Milan, IT;

Fabio Pellizzer, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 13/00 (2006.01); G11C 11/402 (2006.01); G11C 11/4074 (2006.01); G11C 27/00 (2006.01); G11C 7/00 (2006.01); H01L 45/00 (2006.01); H10N 70/20 (2023.01); H10N 70/00 (2023.01);
U.S. Cl.
CPC ...
G11C 11/5678 (2013.01); G11C 13/004 (2013.01); G11C 13/0004 (2013.01); G11C 13/0069 (2013.01); H10N 70/24 (2023.02); H10N 70/826 (2023.02); H10N 70/882 (2023.02); G11C 13/0002 (2013.01); G11C 13/0007 (2013.01); G11C 2013/0052 (2013.01); G11C 2013/0092 (2013.01); G11C 2213/30 (2013.01); G11C 2213/31 (2013.01); G11C 2213/71 (2013.01);
Abstract

Methods, systems, and devices related to a multi-level self-selecting memory device are described. A self-selecting memory cell may store one or more bits of data represented by different threshold voltages of the self-selecting memory cell. A programming pulse may be varied to establish the different threshold voltages by modifying one or more durations during which a fixed level of voltage or fixed level of current is maintained across the self-selecting memory cell. The self-selecting memory cell may include a chalcogenide alloy. A non-uniform distribution of an element in the chalcogenide alloy may determine a particular threshold voltage of the self-selecting memory cell. The shape of the programming pulse may be configured to modify a distribution of the element in the chalcogenide alloy based on a desired logic state of the self-selecting memory cell.


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