The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Dec. 18, 2019
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Wentian Zhou, San Jose, CA (US);

Liangjiang Yu, San Jose, CA (US);

Teng Wang, San Jose, CA (US);

Lingling Pu, San Jose, CA (US);

Wei Fang, Milpitas, CA (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/774 (2022.01); G06F 18/214 (2023.01); G06V 10/776 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06F 18/214 (2023.01); G06T 7/0006 (2013.01); G06V 10/776 (2022.01); G06V 10/993 (2022.01); G06T 2207/10061 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Disclosed herein is a method of automatically obtaining training images to train a machine learning model that improves image quality. The method may comprise analyzing a plurality of patterns of data relating to a layout of a product to identify a plurality of training locations on a sample of the product to use in relation to training the machine learning model. The method may comprise obtaining a first image having a first quality for each of the plurality of training locations, and obtaining a second image having a second quality for each of the plurality of training locations, the second quality being higher than the first quality. The method may comprise using the first image and the second image to train the machine learning model.


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