The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jun. 15, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Hsin-Chi Chen, Tainan, TW;

Hsun-Ying Huang, Tainan, TW;

Chih-Ming Lee, Tainan, TW;

Shang-Yen Wu, Tainan, TW;

Chih-An Yang, Tainan, TW;

Hung-Wei Ho, Kaohsiung, TW;

Chao-Ching Chang, Kaohsiung, TW;

Tsung-Wei Huang, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 23/00 (2006.01); H01L 21/768 (2006.01); H01L 23/488 (2006.01);
U.S. Cl.
CPC ...
H01L 24/14 (2013.01); H01L 21/76802 (2013.01); H01L 21/76877 (2013.01); H01L 23/488 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/13 (2013.01);
Abstract

A semiconductor device structure, along with methods of forming such, are described. The structure includes a substrate having one or more devices formed thereon, one or more bonding pads disposed over the substrate, and a first passivation layer disposed over the one or more bonding pads. The first passivation layer includes a first passivation sublayer having a first dielectric material, a second passivation sublayer disposed over the first passivation sublayer, and the second passivation sublayer has a second dielectric material different from the first dielectric material. The first passivation layer further includes a third passivation sublayer disposed over the second passivation sublayer, and the third passivation sublayer has a third dielectric material different from the second dielectric material. At least two of the first, second, and third passivation sublayers each includes a nitride.


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