The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jan. 29, 2020
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventor:

Malay K. Ganai, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3308 (2020.01); G06F 7/58 (2006.01);
U.S. Cl.
CPC ...
G06F 30/3308 (2020.01); G06F 7/582 (2013.01); G06F 2101/14 (2013.01);
Abstract

Techniques and systems for generating constrained random stimuli during functional verification of a design under verification (DUV) are described. Some embodiments can compute an observed probability distribution for each variable in a set of variables based on at least a first random solution generated using a set of constraints that are defined over the set of variables. The embodiments can then compute a correction probability distribution for each variable in the set of variables based on the observed probability distribution and an intended probability distribution. Next, while generating at least a second random solution using the set of constraints, the embodiments can select a random value for a given variable in the set of variables based on the correction probability distribution for the given variable. The observed probability distribution can be continuously updated and stored as constrained random stimuli are generated.


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