The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jan. 15, 2021
Applicant:

Innoscience (Suzhou) Technology Co., Ltd., Suzhou, CN;

Inventors:

Rong Yang, Suzhou, CN;

Sichao Li, Suzhou, CN;

Chunhua Zhou, Suzhou, CN;

Donghua Bai, Suzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2621 (2013.01);
Abstract

The subject application provides an apparatus and method for measuring dynamic on-resistance of a device under test (DUT) comprising a control terminal electrically connected to an output of a first controlling module being configured to generate a first control signal to switch on and off the DUT. The apparatus comprises a switching device and a second controlling module configured to: receive the first control signal from the first controlling module and generate a second control signal to switch on and off the switching device such that the switching device is turned on later than the DUT for a first time interval and turned off earlier than the DUT for a second time interval.


Find Patent Forward Citations

Yang, Rong. (2023). Apparatus and method for measuring dynamic on-resistance of gan-based device (U.S. Patent No. 11747390). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11747390

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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