The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Jun. 10, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Saeed Sharifi Tehrani, San Diego, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/26 (2006.01); G11C 29/52 (2006.01); G11C 7/10 (2006.01); G11C 29/42 (2006.01); G11C 16/34 (2006.01); G11C 7/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 7/04 (2013.01); G11C 7/1045 (2013.01); G11C 7/1072 (2013.01); G11C 16/3404 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); G11C 2207/2254 (2013.01);
Abstract

A method includes receiving a request to perform a set of read operations. The method includes selecting a random read operation of the set of read operations, where the random read operation is performed on a first wordline located on a first portion of a first data block on a memory device. The method includes performing an error detection operation on a second wordline and a third wordline located on the first portion of the first data block to determine an error rate associated with the second wordline and third wordline, where the second wordline and the third wordline are adjacent to the first wordline. The method includes determining whether the error rate satisfies a threshold criterion responsive to determining that the error rate satisfies the threshold criterion and migrating data stored on the first portion of the first data block to a second data block on the memory device.


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