The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Aug. 19, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Seungjune Jeon, Santa Clara, CA (US);

Tingjun Xie, Milpitas, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/0727 (2013.01); G06F 11/3034 (2013.01); G06F 11/3476 (2013.01);
Abstract

A method includes monitoring, by a processing device, error characteristics of a particular memory component among a plurality of memory components of a memory sub-system and detecting, by the processing device and based on the monitored error characteristics, an error characteristic associated with the particular memory component that exhibits a value that is greater than or equal to a threshold error characteristic value. The method can further include causing, by the processing device, a counter coupled to the plurality of memory components to be updated in response to the detection that the particular memory component exhibits the value of the error characteristic that is greater than or equal to the threshold error characteristic value.


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