The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Apr. 29, 2021
Applicant:

Mujin, Inc., Tokyo, JP;

Inventors:

Atilla Saadat Dehghan, Tokyo, JP;

Kei Usui, Tokyo, JP;

Assignee:

MUJIN, INC., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 9/06 (2006.01); B25J 13/08 (2006.01); B25J 9/12 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1664 (2013.01); B25J 9/06 (2013.01); B25J 9/12 (2013.01); B25J 9/1633 (2013.01); B25J 9/1692 (2013.01); B25J 13/085 (2013.01); B25J 9/1641 (2013.01); G05B 2219/37373 (2013.01); G05B 2219/39181 (2013.01);
Abstract

A computing system and method are presented. The computing system may store sensor data which includes: (i) a set of movement data, and (ii) a set of actuation data. The computing system may divide the sensor data into training data and test data by: (i) selecting, as the training data, movement training data and corresponding actuation training data, and (ii) selecting, as the test data, movement test data and corresponding actuation test data. The computing system may determine, based on the movement training data and the actuation training data, at least one of: (i) a friction parameter estimate or (ii) a center of mass (CoM) estimate, and may determine actuation prediction data based on the movement test data and based on the at least one of the friction parameter estimate or the CoM estimate. The computing system may further determine residual data, and determine a value for an error parameter.


Find Patent Forward Citations

Saadat Dehghan, Atilla. (2023). Method and computing system for determining a value of an error parameter indicative of quality of robot calibration (U.S. Patent No. 11717966). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11717966

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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