The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Aug. 29, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Priyanka Dobriyal, Santa Clara, CA (US);

Susheel G. Jadhav, Los Gatos, CA (US);

Ankur Agrawal, Chandler, AZ (US);

Quan A. Tran, Fremont, CA (US);

Raiyomand F. Aspandiar, Portland, OR (US);

Kenneth M. Brown, Tempe, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/0234 (2021.01); G02F 1/015 (2006.01); H01S 5/0237 (2021.01); H01S 5/02234 (2021.01); H01S 5/02325 (2021.01); H01S 5/026 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0234 (2021.01); G02F 1/015 (2013.01); H01S 5/0237 (2021.01); H01S 5/02234 (2021.01); H01S 5/02325 (2021.01); H01S 5/0261 (2013.01);
Abstract

An integrated circuit assembly includes a support (e.g., package substrate or circuit board) and a semiconductor die including a device. The semiconductor die is mounted to the support with the device facing the support. The device can be, for example, a quantum well laser device or a photonics device. A layer of decoupling material is on the device. An underfill material is between the semiconductor die and the support, where the decoupling material is between the device and the underfill material. The decoupling layer decouples stress from transferring from the underfill material into the device. For example, the decoupling material forms only weak bonds with the underfill material and/or a passivation layer on the device, in an embodiment. Weak bonds include non-covalent bonds and non-ionic bonds, for example. The decoupling material can be, for instance, a PTFE film, a poly(p-xylylene) film, a fluorocarbon, or a compound lacking free hydroxyl groups.


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