The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Mar. 24, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Christopher M. Smitchger, Boise, ID (US);

Gary F. Besinga, Boise, ID (US);

Renato C. Padilla, Folsom, CA (US);

Tawalin Opastrakoon, Boise, ID (US);

Sampath K. Ratnam, Boise, ID (US);

Michael G. Miller, Boise, ID (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/10 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3418 (2013.01); G11C 16/105 (2013.01); G11C 16/26 (2013.01); G11C 29/50004 (2013.01);
Abstract

A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including identifying an amount of storage charge loss (SCL) that has occurred on an open block of the memory device, the open block having one or more erased pages, determining that the amount of SCL satisfies a threshold criterion corresponding to an acceptable amount of SCL to occur on the open block, and responsive to determining that the amount of SCL satisfies the threshold criterion, keeping the open block open for programming the one or more erased pages.


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