The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Dec. 27, 2020
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Hui-Lin Wang, Taipei, TW;

Tai-Cheng Hou, Tainan, TW;

Wei-Xin Gao, Tainan, TW;

Fu-Yu Tsai, Tainan, TW;

Chin-Yang Hsieh, Tainan, TW;

Chen-Yi Weng, New Taipei, TW;

Jing-Yin Jhang, Tainan, TW;

Bin-Siang Tsai, Changhua County, TW;

Kun-Ju Li, Tainan, TW;

Chih-Yueh Li, Taipei, TW;

Chia-Lin Lu, Taoyuan, TW;

Chun-Lung Chen, Tainan, TW;

Kun-Yuan Liao, Hsinchu, TW;

Yu-Tsung Lai, Tainan, TW;

Wei-Hao Huang, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 43/12 (2006.01); H10N 50/10 (2023.01); H01L 21/768 (2006.01); H01L 21/762 (2006.01); H10N 50/80 (2023.01); H10N 35/01 (2023.01);
U.S. Cl.
CPC ...
H10N 50/10 (2023.02); H01L 21/762 (2013.01); H01L 21/76802 (2013.01); H10N 50/80 (2023.02); H10N 35/01 (2023.02);
Abstract

A method for fabricating semiconductor device includes the steps of: forming a first magnetic tunneling junction (MTJ) on a substrate; forming a first ultra low-k (ULK) dielectric layer on the first MTJ; performing a first etching process to remove part of the first ULK dielectric layer and forming a damaged layer on the first ULK dielectric layer; and forming a second ULK dielectric layer on the damaged layer.


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