The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Apr. 06, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kandabara Tapily, Mechanicville, NY (US);

Jeffrey Smith, Clifton Park, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/522 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76897 (2013.01); H01L 21/76808 (2013.01); H01L 21/76816 (2013.01); H01L 21/76843 (2013.01); H01L 23/5226 (2013.01);
Abstract

A semiconductor device includes conductive structures formed in a first dielectric layer, a conductive cap layer selectively positioned over the conductive structures and the first dielectric layer with a top surface and sidewalls, a second dielectric layer selectively positioned over the first dielectric layer and disposed between the sidewalls of the conductive cap layer, a third dielectric layer selectively positioned over the second dielectric layer and disposed between the sidewalls of the conductive cap layer, a fourth dielectric layer arranged over the conductive structures and the third dielectric layer, and an interconnect structure formed in the fourth dielectric layer. The interconnect structure includes a trench structure and a via structure that is positioned below the trench structure and connected to the trench structure. The via structure includes a first portion positioned over the conductive cap layer and a second portion disposed over the first portion and the third dielectric layer.


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