The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Mar. 25, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Wu-Hung Ko, Hsinchu, TW;

Kun-Lung Hsieh, Hsinchu, TW;

Chih-Wei Wen, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/44 (2012.01); G03F 1/54 (2012.01); G03F 1/64 (2012.01); G03F 1/62 (2012.01); G03F 1/84 (2012.01); G03F 1/46 (2012.01); G03F 1/32 (2012.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 1/44 (2013.01); G03F 1/32 (2013.01); G03F 1/46 (2013.01); G03F 1/54 (2013.01); G03F 1/62 (2013.01); G03F 1/64 (2013.01); G03F 1/84 (2013.01); G03F 7/70983 (2013.01);
Abstract

A method of testing a photomask assembly includes placing the photomask assembly into a chamber, wherein the photomask assembly includes a pellicle attached to a first side of a photomask. The method further includes exposing the photomask assembly to a radiation source having a wavelength ranging from about 160 nm to 180 nm in the chamber to accelerate haze development, wherein the exposing of the photomask assembly includes illuminating an entirety of an area of the photomask covered by the pellicle throughout an entire illumination time and illuminating a frame adhesive attaching the pellicle to the photomask. The method further includes detecting haze of the photomask following exposing the photomask assembly to the radiation source. The method further includes predicting performance of the photomask assembly during a manufacturing process based on the detected haze of the photomask following exposing the photomask assembly to the radiation source.


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