The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Jun. 21, 2021
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Xuedong Liu, San Jose, CA (US);

Weiming Ren, San Jose, CA (US);

Shuai Li, Beijing, CN;

Zhongwei Chen, San Jose, CA (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/147 (2006.01); H01J 37/28 (2006.01); H01J 37/04 (2006.01); H01J 37/153 (2006.01);
U.S. Cl.
CPC ...
H01J 37/147 (2013.01); H01J 37/04 (2013.01); H01J 37/153 (2013.01); H01J 37/28 (2013.01); H01J 2237/061 (2013.01); H01J 2237/083 (2013.01); H01J 2237/1532 (2013.01); H01J 2237/1534 (2013.01); H01J 2237/2817 (2013.01);
Abstract

One modified source-conversion unit and one method to reduce the Coulomb Effect in a multi-beam apparatus are proposed. In the modified source-conversion unit, the aberration-compensation function is carried out after the image-forming function has changed each beamlet to be on-axis locally, and therefore avoids undesired aberrations due to the beamlet tilting/shifting. A Coulomb-effect-reduction means with plural Coulomb-effect-reduction openings is placed close to the single electron source of the apparatus and therefore the electrons not in use can be cut off as early as possible.


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