The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Oct. 26, 2021
Applicant:
Stmicroelectronics International N.v., Geneva, CH;
Inventors:
Venkata Narayanan Srinivasan, Greater Noida, IN;
Manish Sharma, Haryana, IN;
Tripti Gupta, Noida, IN;
Assignee:
STMicroelectronics International N.V., Geneva, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G06F 1/28 (2006.01); G01R 31/3185 (2006.01); G06F 1/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31721 (2013.01); G06F 1/28 (2013.01); G01R 31/31723 (2013.01); G01R 31/318513 (2013.01); G01R 31/318536 (2013.01); G01R 31/318555 (2013.01); G01R 31/318558 (2013.01); G01R 31/318575 (2013.01); G06F 1/18 (2013.01);
Abstract
Described herein are integrated circuit chips having test circuitry designed such that independently selectable testing of different power domains using a same scan chain compressor-decompressor circuit may be performed. Also disclosed herein are integrated circuit chips having test circuitry designed such that independently selectable testing of different power domains using multiple different scan chain compressor-decompressor circuits may be performed.