The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Mar. 01, 2021
Applicant:

Murata Manufacturing Co., Ltd., Kyoto-fu, JP;

Inventors:

Isao Obu, Nagaokakyo, JP;

Shigeki Koya, Nagaokakyo, JP;

Yasunari Umemoto, Nagaokakyo, JP;

Takayuki Tsutsui, Nagaokakyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/082 (2006.01); H01L 23/00 (2006.01); H01L 29/205 (2006.01); H01L 29/73 (2006.01); H01L 29/737 (2006.01); H01L 29/66 (2006.01); H01L 23/498 (2006.01); H01L 21/8252 (2006.01); H03F 3/20 (2006.01); H03F 1/56 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0823 (2013.01); H01L 21/8252 (2013.01); H01L 23/49827 (2013.01); H01L 23/49844 (2013.01); H01L 24/11 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H01L 29/205 (2013.01); H01L 29/66318 (2013.01); H01L 29/7304 (2013.01); H01L 29/7371 (2013.01); H01L 2223/6655 (2013.01); H01L 2224/11462 (2013.01); H01L 2224/13019 (2013.01); H01L 2224/13025 (2013.01); H01L 2224/13082 (2013.01); H01L 2224/13144 (2013.01); H01L 2224/13147 (2013.01); H01L 2224/13166 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/81815 (2013.01); H03F 1/56 (2013.01); H03F 3/20 (2013.01); H03F 2200/222 (2013.01); H03F 2200/318 (2013.01); H03F 2200/387 (2013.01);
Abstract

A semiconductor device has a semiconductor substrate, and multiple first bipolar transistors on the first primary surface side of the semiconductor substrate. The first bipolar transistors have a first height between an emitter layer and an emitter electrode in the direction perpendicular to the first primary surface. The semiconductor device further has at least one second bipolar transistor on the first primary surface side of the semiconductor substrate. The second bipolar transistor have a second height, greater than the first height, between an emitter layer and an emitter electrode in the direction perpendicular to the first primary surface. Also, the semiconductor has a first bump stretching over the multiple first bipolar transistors and the at least one second bipolar transistor.


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